AO3422 N-Channel Enhancement Mode Field Effect Transistor

AO3422 c Vgs Vdd Id Vgs Rg DUT-+ VDC L Vgs Vds Id Vgs BV I Unclamped Inductive Switching (UIS) Test Circuit & Waveforms Ig Vgs-+ VDC DUT L Vds Vgs Vds...

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AO3422 N-Channel Enhancement Mode Field Effect Transistor General Description

Features

The AO3422 uses advanced trench technology to provide excellent RDS(ON) and low gate charge. It offers operation over a wide gate drive range from 2.5V to 12V. This device is suitable for use as a load switch.

VDS (V) = 55V ID = 2.1A (VGS = 4.5V) RDS(ON) < 160mΩ (VGS = 4.5V) RDS(ON) < 200mΩ (VGS = 2.5V)

SOT23 Top View

D

Bottom View D

D

G

S

G S

S

G

Absolute Maximum Ratings TA=25°C unless otherwise noted Symbol Parameter VDS Drain-Source Voltage VGS Gate-Source Voltage Continuous Drain Current A Pulsed Drain Current

TA=25°C

Junction and Storage Temperature Range

Alpha & Omega Semiconductor, Ltd.

W

0.8

TJ, TSTG

t ≤ 10s Steady-State Steady-State

A

1.25 -55 to 150

Symbol A

V

10

PD

TA=70°C

A

±12 1.7

ID IDM

B

Thermal Characteristics Parameter Maximum Junction-to-Ambient Maximum Junction-to-Ambient Maximum Junction-to-Lead C

Units V

2.1

TA=70°C TA=25°C

Power Dissipation

Maximum 55

RθJA RθJL

Typ 75 115 48

°C

Max 100 150 60

Units °C/W °C/W °C/W

AO3422

Electrical Characteristics (TJ=25°C unless otherwise noted) Symbol

Parameter

STATIC PARAMETERS BVDSS Drain-Source Breakdown Voltage

Min

Conditions ID=10mA, VGS=0V

1

IGSS

Gate-Source leakage current

VDS=0V, VGS=±12V

VGS(th)

Gate Threshold Voltage

VDS=VGS ID=250µA

0.6

ID(ON)

On state drain current

VGS=4.5V, VDS=5V

10

RDS(ON)

Static Drain-Source On-Resistance

TJ=55°C

VGS=4.5V, ID=2.1A TJ=125°C VGS=2.5V, ID=1.5A gFS

Forward Transconductance

Diode Forward Voltage IS=1A Maximum Body-Diode Continuous Current

VDS=5V, ID=2.1A

DYNAMIC PARAMETERS Ciss Input Capacitance Coss

Output Capacitance

Crss

Reverse Transfer Capacitance

Rg

Gate resistance

SWITCHING PARAMETERS Qg Total Gate Charge Qgs Gate Source Charge

5 1.3

±100

nA

2

V

125

160

175

210

157

200

mΩ

1

V

1

A

300

pF

11 0.78

VGS=4.5V, VDS=27.5V, ID=2.1A

mΩ

S

31

pF

12.6 VGS=0V, VDS=0V, f=1MHz

µA

A

214 VGS=0V, VDS=25V, f=1MHz

Units V

VDS=44V, VGS=0V

Zero Gate Voltage Drain Current

VSD

Max

55

IDSS

IS

Typ

pF

1.3

3



2.6

3.3

nC

0.6

nC

Qgd

Gate Drain Charge

0.8

nC

tD(on)

Turn-On DelayTime

2.3

ns

tr

Turn-On Rise Time

tD(off)

Turn-Off DelayTime

tf

Turn-Off Fall Time

trr

Body Diode Reverse Recovery Time

IF=2.1A, dI/dt=100A/µs

20

Qrr

Body Diode Reverse Recovery Charge IF=2.1A, dI/dt=100A/µs

17

VGS=10V, VDS=27.5V, RL=12Ω, RGEN=3Ω

2.4

ns

16.5

ns

2

ns 30

ns nC

2

A: The value of R θJA is measured with the device mounted on 1in FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The value in any given application depends on the user's specific board design. The current rating is based on the t ≤ 10s thermal resistance rating. B: Repetitive rating, pulse width limited by junction temperature. C. The R θJA is the sum of the thermal impedence from junction to lead R θJL and lead to ambient. D. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max. 2 E. These tests are performed with the device mounted on 1 in FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The SOA curve provides a single pulse rating. Rev2: Sep 2010 THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN, FUNCTIONS AND RELIABILITY WITHOUT NOTICE.

Alpha & Omega Semiconductor, Ltd.

AO3422

TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 8

10 10V

3.5V

8 6

2.5V

ID(A)

ID (A)

VDS=5V

6

5V

4

4

125°C 2

VGS=2V

2

25°C

0

0 0

1

2

3

4

5

1

1.25

1.75

2

2.25

2.5

VGS(Volts) Figure 2: Transfer Characteristics

200

2

180

1.8

Normalized On-Resistance

RDS(ON) (mΩ)

VDS (Volts) Fig 1: On-Region characteristics

1.5

VGS=2.5V 160 140 120 VGS=4.5V

VGS=4.5

1.6 1.4

VGS=2.5V

1.2 1

100 0

1

2

3

4

0.8

5

0

ID (A) Figure 3: On-Resistance vs. Drain Current and Gate Voltage

25

50

75

100

125

150

175

Temperature (°C) Figure 4: On-Resistance vs. Junction Temperature 1E+01

360

1E+00

310

1E-01

260 IS (A)

RDS(ON) (mΩ)

125°C

ID=2.3A

125°C 210 160

1E-02 25°C

1E-03

110

25°C

1E-04

60 1E-05

10 0

2

4

6

8

10

VGS (Volts) Figure 5: On-Resistance vs. Gate-Source Voltage

Alpha & Omega Semiconductor, Ltd.

0.0

0.2

0.4

0.6

0.8

1.0

1.2

VSD (Volts) Figure 6: Body-Diode Characteristics

1.4

AO3422

TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 400

5

360 VDS=27.5V ID=2.1A

Ciss

320 Capacitance (pF)

VGS (Volts)

4 3 2

280 240 200 160 Coss

120

Crss

80

1

40 0

0 0

1

2 Qg (nC) Figure 7: Gate-Charge Characteristics

0

3

Power (W)

ID (Amps)

10ms

20

25

30

TJ(Max)=150°C TA=25°C

100µs 0.1s

15

15

TJ(Max)=150°C TA=25°C

10.0

1.0

10

VDS (Volts) Figure 8: Capacitance Characteristics

100.0 RDS(ON) limited

5

1ms

1s

10

5

10s DC 0.1 0.1

1

10

100

VDS (Volts) Figure 9: Maximum Forward Biased Safe Operating Area (Note E)

ZθJA Normalized Transient Thermal Resistance

10

D=Ton/T TJ,PK=TA+PDM.ZθJA.RθJA RθJA=100°C/W

0 0.001

0.01

0.1

1

10

100

1000

Pulse Width (s) Figure 10: Single Pulse Power Rating Junction-toAmbient (Note E)

In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse

1

PD

0.1

Ton

T

Single Pulse 0.01 0.00001

0.0001

0.001

0.1 1 10 Pulse Width (s) Figure 11: Normalized Maximum Transient Thermal Impedance

Alpha & Omega Semiconductor, Ltd.

0.01

100

1000

AO3422 c Gate Charge Test Circuit & Waveform Vgs Qg 10V

+

+ Vds

VDC

-

VDC

DUT

Qgs

Qgd

-

Vgs Ig Charge

Resistive Switching Test Circuit & Waveforms RL Vds Vds

DUT

Vgs

+ VDC

Rg

90% Vdd

-

10%

Vgs

Vgs

t d(on)

tr

t d(off)

t on

tf t off

Unclamped Inductive Switching (UIS) Test Circuit & Waveforms L EAR= 1/2 LI

Vds

2 AR

BVDSS

Vds

Id

+

Vgs

Vgs

VDC

Rg

-

Vdd

I AR

Id

DUT Vgs

Vgs

Diode Recovery Tes t Circuit & Waveforms Qrr = - Idt

Vds + DUT

Vds -

Isd

Vgs

L

Vgs Ig

Alpha & Omega Semiconductor, Ltd.

Isd

+ Vdd

VDC

-

IF

trr

dI/dt IRM

Vds

Vdd