Minimum Requirements for Digital Radiography Equipment and

Ewert and Zscherpel 1 ECNDT Requirements for RT-D 8.3 Praha, Oct. 2014 Radiological Methods Minimum Requirements for Digital Radiography Equipment and...

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Minimum Requirements for Digital Radiography Equipment and Measurement Procedures by Different Industries and Standard Organizations Uwe Ewert and Uwe Zscherpel BAM Federal Institute for Materials Research and Testing, Berlin, Germany

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Introduction - Film Radiography has been developed for quality assurance in industry over decades. - It is basis for contractual agreements of Supplier and Purchaser. - Digital Radiography shall achieve the same image quality or better, but with higher efficiency. - Selected image quality requirements of different standards as ASTM, ASME and ISO are compared. - The essential parameters for optimization and prediction of IQI visibility are discussed. - Requirements for equipment selection are derived for CR and DDAs. - Newly developed classification procedures for RT-D equipment are introduced.

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Basic Requirements in Radiography Film

Requirement Standards

Exposure

Detector requirements

Maximum image unsharpness Image quality

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Digital

ISO, CEN, ASTM, ASME

ISO, CEN

Exceed minimum optical density

Exceed minimum required SNRN (Normalized Signal to Noise Ratio)

Use detectors which achieve the required Use required film SNRN and system class or do not exceed the better detector unsharpness limit Do not exceed the Do not exceed the geometrical image unsharpness limits unsharpness limits Achieve IQI contrast Achieve required IQI sensitivity + duplex contrast sensitivity wire resolution Requirements for RT-D

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ASTM, ASME, MAI

DDAs: Exceed minimum required CNR CR: expose to EPS plateau (MAI) Do not exceed image unsharpness limits Do not exceed the image unsharpness limits Achieve required IQI contrast sensitivity 3

Key Technologies for Film Replacement • Computed Radiography (CR) with storage phosphor imaging plates • Digital Detector Arrays (DDA)

CR

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DDA

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Contrast Signal (base material)

Intensity

Intensity

Image Quality in Radiography - Influence of SNR and CNR -

Contrast Signal (base material)

Length

Length

Notch visible!

Notch not visible!

Contrast/Noise is high Signal/Noise is high

Notch is visible Contrast/Noise is low in the profile if Signal/Noise is low C > 2.5  Noise

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Noise Sources in Radiographic Images Typical noise sources in digital radiography: 1. EXPOSURE CONDITIONS: Photon noise, depending on exposure dose (e.g. mAs or GBqmin). This is the main factor! SNR increases with higher exposure dose. 2. Limitation for the maximum achievable SNR: 1. DETECTOR: Structural noise of DDAs and Imaging Plates also called fixed pattern noise (due to variations in pixel to pixel response and inhomogeneities in the phosphor layer). 2. OBJECT: 1. Crystalline structure of material (e.g. nickel based steel, mottling) 2. Surface roughness of test object

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Measurement of Contrast to Noise Ratio in DDA Practice by ASTM E 2698 Noise

I=contrast

• CNR shall be measured in the 4T hole for proof of image quality. • A minimum CNR of 2.5 is required by ASTM E 2698. • This value needs to be revised!

ASTM E 1025

I

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CNR = 6.7 C = I = 473 Noise = 71 SNR = 155 7

Human Observer Model: Perception Threshold PT ASTM E 2698

50 µm pixel size Diameter 0.12 0.25 0.5

1

Noise = 1000 Signal = 30000

2 mm

requires CNR > 2.5 Needs revision!

 Large area flaws are better visible than small ones at d - diameter same Contrast-to-Noise of hole Ratio

CNR = 2.5

CNR = 1.25

CNR = 0.625

 Each column has holes with same diameter

Flat bottom holes of different depth and diameter

SRb image = 50 µm

PTconst

d   CNR SRb

 Each row has indications with same CNR = Cdepth/

PTconst - constant human perception threshold  10 d – diameter of just visible hole CNR - contrast to noise ratio SRb – basic spatial resolution (effective pixel size)

Rose approach, 1946

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System Selection for ASTM Standard Practice  ASTM Draft, “Practice for the Use of Digital Detector Arrays and Computed Radiology for Aerospace Casting Inspections” requires  a minimum basic spatial resolution of the detector (SRbdetector) if images have been taken without magnification or  a minimum basic spatial resolution in the magnified image SRbimage).

Effective pixel size of digital image ( SRimage ) b

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Verification of CNRmin for ASTM Standard Practice  ASTM Draft, “Practice for the Use of Digital Detector Arrays and Computed Radiology for Aerospace Casting Inspections” and E 2698 “Standard Practice for Radiological Examination Using Digital Detector Arrays” require for digital images with DDAs in the 2T IQI hole:

CNRmin  2.5  The ASTM E 2698 value (CNR = 2.5) is optimized for testing of thin objects with thickness < ½” and typical DDAs in the range of 0.1 mm < SRb < 130 µm.  Generally, CNRmin for all digital images can be described more accurate by the equation:

CNRmin

10  SRbimage  diameterIQI  hole

Based on “old” Rose equation as shown before for PTconstant

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Contrast Sensitivity as Required by Different Standards  Almost all standards require image quality indicators on each production radiograph.  The operator has to evaluate if the required image quality has been achieved.  He decides about acceptance or rejection of the production radiographs.  Different international standards require different contrast sensitivities, which yields different inspection quality.  The thickness sensitivity improves with material thickness. 8.3 Radiological Methods

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Basic Requirements for IQI Visibility of International Standards in Comparison ISO 19232-3

Step Holes, ISO 17636-2, 2013 Plate Holes, ASME BPVC SC V Ar. 2 Plate Holes, ASTM E 1742, E 2104 ASME BPVC SC V, Ar. 2, and ISO 17636-class A are about equivalent ASTM E1742, E 2104, ISO 17636-class B are about equivalent below t=12 mm (1/2“)

ASTM E 1025

ISO 19232-2

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Additional Requirements for Unsharpness and Basic Spatial Resolution  In all film radiography standards the permitted geometric unsharpness (Ug) is limited and the film unsharpness is neglected.  In digital radiography the detector unsharpness (Udetector) contributes significantly to the image unsharpness (Uim) or total unsharpness (UT).  Therefore, the permitted detector unsharpness (Udetector) is limited in different standard systems, which is relevant for detector selection.  The detector unsharpness shall be always smaller than the permitted geometric unsharpness (Udetector < Ug).  The basic spatial resolution is defined as ½ unsharpness in digital radiography (SRb = ½ U).

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Measurement of Basic Spatial Resolution

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1m SDD, small focus

• The detector unsharpness udetector shall be controlled by reference exposures with the duplex wire IQI.

Duplex Wire IQI, 90 kV,

Duplex wire IQI ASTM E 2002 Two new ISO 19232-5 wire pairs ASTM E 2002

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Standard ISO 17636-2 (2013): Table B.13, B.14

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CR

DDA

Maximum detector or image unsharpness (2SRb)

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Unsharpness Requirements of Different International Standards – No International Harmonization Unsharpness requirements 0,08

E 1030, 1032

Unsharpness in inch

0,07 0,06

E 1030 (2004)

0,05

MAI E 2104

0,04 0,03

E 1742

0,02

ISO 17636 class A ISO 17636 class B

0,01 0,00 0,0

1,0

2,0

3,0

Thickness in inch

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4,0

5,0

Co-60, High Energy

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6,0

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Unsharpness Requirements in Different Int. Standards

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EPS= equivalent penetrameter sensitivity (see ASTM E 746, E 747, E 1025)

Qualification of CR-Systems - The EPS Concept EPS – Procedure is proposed accepted for CR qualification in ASTM E 20445/6 draft and the draft on “Practice for the Use of … Computed Radiology for Aerospace Casting Inspections” (USA: MAI – group)

- The EPS (equivalent penetrameter sensitivity) measurement is based on ASTM E 746

 A smooth ¾ inch (19 mm) steel plate with a set of plate holes is radiographed at 200 kV in ≥ 1 m distance  The exposure is performed with different mAs settings  A graph is generated, see next pages  The calculation of just visible hole diameter is given by:

d visible

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SRbimage  PT   eff  SNR

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ASTM E 746 PT depends slightly on operator and viewing conditions µeff for 200 kV and 19 mm Fe is about 0,05 mm-1

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Example: EPS Test with HD CR Scanner at 20 µm Pixel Size

Do you see the holes?

¾” (19 mm) steel plate, 200 kV 1 mm steel step for measurement of µeff

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CNR  0.8

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Visibility of EPS holes (E 746)

Do you see the holes?

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New Formula for Conversion of SNRN Measurements to EPS Values and Working Range for CR (ASTM Draft E 2033)  PT’ is about 2▪100 for visibility of the 2 T hole of IQIs corr. to ASTM E 1025  EPS by ASTM E 746 with 200 kV, t = 19 mm Fe plate and µeff = 0.05 mm-1

EPS method for determination of performance levels Measured EPS,IP 1, Scanner 2

Best fit

Level I

level II

2,6

EPS 

2,4 140

EPS

2,2 2

350

Level II: PV 140 – 4095

1,8 1,6

aEPS = 1.16

Level I: PV 350 – 4095

1,4 1,2

90% PVmax

1

0

500

1000

1500

2000

Plateau range 0

23

46

69

2500

3000

3500

4000

137

160

183

450

Pixel value  91

114

206

Dose / mGy EPS= equivalent penetrameter sensitivity (see ASTM E 746, E 747, E 1025)

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PT ' ttestplate

SRbimage µeff  SNR

Old CR Classification Scheme System class CEN

Minimum normalised SNR

IP 1/Y

130

IP 2/Y

117

IP 3/Y

78

IP 4/Y

65

IP 5/Y

52

IP 6/Y

43

Note 1: The normalized SNR values of Table 1 are similar to those of EN 584-1. They are calculated by SNR= log(e) (Gradient/Granularity) of Table 1 in EN 584-1. The measured SNR values are calculated from linearised signal data.

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Classification scheme of ASTM; e 2446, EN 14784-1 and ISO 16371-1 by system classes. The CR systems are classified by the maximum achievable SNRN (IP 1 – 6) and the basic spatial detector resolution SRbdetector (Y).

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New CR Classification Scheme New classification by performance levels as given in the draft revision of ASTM E 2446 (2014). Additionally, a specified EPS performance is required. CR System Minimum Classification SNRN (normalized to SRb=88.6 µm)

Maximum iSRbdetector value [µm]

Maximum achieved EPS by E 746 [%]

CR Special

200

50

1.00

CR Level I

100

100

1.41

CR Level II

70

160

1.66

CR Level III

50

200

1.92

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Qualification “Spidernet” Graph and Classification Statement

Qualification of CR‐System XY  Interpolated SRbdetector for E 2795, ISO 17636-2 users SRbdetector = 145µm 14 12 10 8 6 4 2 0

Achievable SNRN for ISO 17636-2 user aSNRN = 88

Achievable CS for E 2597 user Csa = 0,8

Performance level II

Speed as defined for film ISO Speed@SNRN130 =  400

aEPS@mag 1 = 1,65

Achievable EPS Specific for CR Efficiency@1mGy =  115

Efficiency as defined for DDAs in E 2597

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New Qualification Procedures Required Test for ASTM E 2445/2446

Required Result

Geometric Distortion Laser Jitter Laser Beam Scan Line Integrity Scan column dropout Scanner Slippage Imaging plate Artifacts Erasure Shading or banding

Fail if distortion > 2% Not permitted, Not permitted Not permitted Not permitted Not permitted Fail if > 2% Fail if more than ±10%

Test results shall be reported, classification is possible in case of exceeding the limits PMT Non-linearity Burn-In Spatial Linearity Imaging plate response variation

Result to report

Optional test on request Imaging Plate Fading (no test object required), optional test

Result to report Report fading in %,

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Report if > 2% Report if > 2% < 2% Report if > ±10%

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Requirements for Digital Detector Arrays Qualification by ASTM E 2597M

DDA

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BAM 5, 8mm steel FujiFilm IX25 SNRN ~ 265

DDA Technology provides better image quality than film with a special calibration procedure!

Best (slowest) NDT film

Images high pass filtered for better presentation

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PerkinElmer 1620 SNRN ~ 1500 Magn. = 3.5

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Qualification of Digital Detector Arrays - Management of Underperforming Pixels A bad pixel can be corrected if it has at least 5 good neighbors ASTM E 2597M

Definition and Test of Bad Pixels: 6.2.1.1 Dead Pixel 6.2.1.2 Over Responding Pixel 6.2.1.3 Under Responding Pixel 6.2.1.4 Noisy Pixel 6.2.1.5 Non-Uniform Pixel 6.2.1.6 Persistence/Lag Pixel 6.2.1.7 Bad Neighborhood Pixel

6.2.2 Types or Groups of Bad Pixels: 6.2.2.1 Single Bad Pixel 6.2.2.2 Cluster of Bad Pixels 6.2.2.3 A cluster without any CKP is well correctable. 6.2.2.4 A cluster with CKP is labeled a relevant cluster. 6.2.2.5 A single bad line segment is a special irrelevant cluster.

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Qualification of Digital Detector Arrays - Pixel Coverage Recommendations -

ASTM E 2736

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Qualification of Digital Detector Arrays - Management of Underperforming Pixels -

ASTM E 2736

Compensation Principles

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Compensation Principle (II) of ISO 17636-2 Compensation of high detector unsharpness by increased SNR • Unsharp digital systems may be applied for NDT if they enable to compensate the missing sharpness by increased SNR. • That means, achieves a digital system not the required visibility of the separated duplex wires, it can be used for NDT, if one or two single wires more than required (see tables B.1 –B.12 of ISO/DIS 17636-2) can be seen clearly in the digital image for one or two missing duplex wire pairs. Compensation of 3 wires vs. wire pairs requires agreement of contracting parties. • Compensation principle (II): • High detector unsharpness can be compensated by increased SNR

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Example : Compensation Principle (II) of ISO 17636-2 Interesting for detectors with higher unsharpness Compensate missing spatial resolution by increased single wire sensitivity: • A lower spatial resolution i.e. a lower double wire score (D) may be compensated by a higher single wire sensitivity i.e. higher single wire score (W). • Max. two (or three) single/double wire scores may be exchanged.

Duplex wire score Single wire score

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Not OK D13 W13

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Required:

OK:

OK

D12 W14

D11 W15

D10 W16

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OK by agreement D9 W17 32

Qualification of Digital Detector Arrays - Efficiency Measurement 120 kV, 3 mm Cu

120 kV, 40 mm Al

160 kV

50 kV 90 kV

Qualification by ASTM E 2597M 220 kV, 40 mm Al

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Qualification of Digital Detector Arrays - Image Lag Qualification by ASTM E 2597M

Important for CT and fast measurements as e.g. automated defect recognition (ADR).

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Qualification of Digital Detector Arrays - Contrast Sensitivity by CNR-Step Wedge Measurement Qualification by ASTM E 2597M

Step wedge with notch Measure contrast and noise per step

Contrast sensitivity (CA) at 5% notch in a step wedge by 1/CNR

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Qualification of Digital Detector Arrays - Contrast Sensitivity by CNR-Step Wedge Measurement Qualification by ASTM E 2597M

Working range (4s)

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Qualification of Digital Detector Arrays - SMTR by SNR-Step Wedge Measurement Qualification by ASTM E 2597M

SNR = 250

SNR = 130

Specific Material Thickness Range by SNR limits

Qualification by ASTM E 2597M

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Qualification of Digital Detector Arrays DDAs are qualified by different tests of ASTM E 2597. Five relevant parameters shall be provided:     

Basic spatial resolution (SRb) Specific Material Thickness Range Efficiency Image lag Contrast sensitivity

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Conclusions 

Replacement of film radiography by digital techniques in NDT requires careful selection of suitable digital detectors.



Standards on digital radiography were published and revised since 2005 in ISO, CEN, ASTM and ASME, defining requirements for image quality and detector selection.



International standards define different requirements for image quality and detector selection.



The image quality depends on the essential parameters: specific contrast µeff, SNR and basic spatial resolution SRb.



CR is accepted as film replacement technology: 

The prove of image quality requires SNRN measurements and IQI visibility (ISO 176362).



CR classification and qualification is under major revision. 



DDAs achieve a significantly better contrast sensitivity with suitable detector calibration than film radiography. 



Classification will consider SNRN, SRbdetector and EPS

The prove of image quality requires CNR measurements and IQI visibility (ASTM practice E 2798).

DDAs are qualified by different but similar procedures than CR systems, because the DDA detector calibration and image integration influences seriously the qualification, and DDAs provide currently better image quality than CR.

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